Atomic force microscopy and force modulation microscopy of coiled carbon nanotubes

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Log Number: 25 Abstract Submitted to the

Atomic force microscopy and force modulation microscopy of coiled carbon nanotubes^*

P. Simonis^a, A. Volodin^b, V. Meunier^c, M. Ahlskog^b, Ph. Lambin^c, Ch. Van Haesendonck^b

^a Laboratoire de Spectroscopie Moleculaire de Surface, Facultes Universitaires Notre-Dame de la Paix, rue de Bruxelles 61, B-5000 Namur, Belgium
^b Laboratorium voor Vaste-Stoffysica en Magnetisme, K. U. Leuven, Celestijnenlaan 200D, B-3001 Leuven, Belgium
^c Laboratoire de Physique du Solide, rue de Bruxelles 61, 5000 Namur, Belgium
Contact e-mail: priscilla.simonis@fundp.ac.be

Depending on the way they are produced, carbon nanotubes can reveal different morphologies. Coiled carbon nanotubes can be found in nanotube material produced by catalytic decomposition of acetylene. We have used scanning electron microscopy (SEM) and atomic force microscopy (AFM) in the non-contact and tapping mode to image multiwalled coiled nanotubes of different diameter and length which have been deposited on oxidized silicon substrates. The elastic response has been probed with force modulation microscopy (FMM) in the tapping mode, allowing to determine the Young modulus of the coils. Our experimental results can be compared to theoretical model calculations, providing the possibility to check whether the coiled nanotubes are elastically deformed straight nanotubes or structures containing topological defects such as pentagon-heptagon pair defects.

^* This work has been supported by the Belgian Inter-University Attraction Poles research program on Reduced Dimensionality Systems (PAI/UIAP No. 4/10).

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